Publication date: 24 June 2010
Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Bernhard Lorenz, Director of Engineering, will present a paper titled “Test in Carriers - The New Test Solution” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco. The presentation will be held during TechSITE’s Test Challenges session on Wednesday, July 14, 2010 from 10:50-11:10 a.m. in the North Hall.
The new test concept, Test in carrier, reduces the cost of test, tackling the key cost driving parameters: highest test parallelism with highest OEE at all temperatures and full package convertibility from large packages down to 1x1mm WSP (Wafer Scale Packages).
The test in carrier process enables testing of singulated devices in very robust handling systems offering a MUBA (Mean Unit Between Assist) in the range of 500,000. Using the in carrier process, operator assist interactions that can lead to human errors are minimized.
Bernhard Lorenz studied mechanical engineering at the Technical University in Munich. After serving as VP of R&D in a medical equipment company, he joined Multitest in 2007 as Business Unit Manager. In 2009, Lorenz took over the responsibility of all handler engineering and became a member of the Multitest Board.
Multitest Elektronische Systeme GmbH, Rosenheim is one of the world’s leading manufacturers of test equipment for semiconductor. Under the brands Multitest, ECT Interface Products and Harbor Electronics Multitest market test handlers, contactors and ATE printed circuits boards. It has offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand. Multitest has an annual turnover of greater than 100 million EURO and currently employs more than 750 people.www.multitest.com
